Global Online Auction

SURPLUS TO ONGOING OPERATIONS: AMD (ADVANCED MICRO DEVICES) -  UNPRECEDENTED STATE OF THE ART FAILURE ANALYSIS LABORATORY

Auction Dates:
Starts: Monday, June 17, 2013 - 9:00am (CST)
Ends: Tuesday, June 18, 2013 - 2:00pm (CST)
Auction Type: Global Online Auction
Location: 7171 Southwest Parkway, Austin, TX 78735
Description:

SURPLUS TO ONGOING OPERATIONS: AMD (ADVANCED MICRO DEVICES) - UNPRECEDENTED STATE OF THE ART FAILURE ANALYSIS LABORATORY

In Conjunction With Maynards Industries

(2008) CHA SOLUTION ELECTRON BEAM EVAPORATOR: With 4 Pocket E-Beam Evaporator (4 X 25 CC) With 10 KW Power Supply. Equipped With Cryo Pump & With PLC: Siemens Touch Screen System Controller. Has 3 –cm Dia Ion Beam Source (Veeco With GFC-1000 Mass Flow Controller & Power Supply) For IBAD (Ion Beam Assisted Deposition). Complete With Adjustable Angle Planetary. The System Is Fully Functional.

ALPHA LICAT LASER SCANNING MICROSCOPE: Downward Looking Laser Scanning Microscope (LSM) With 500MW 1064 Laser & A New (In 2012) 1340 Laser . System Has 5X/10X/20X/50X/100X Optics. Sourcemeter: Keithley Model 2420 (+/-60V, +/-3A Sourcemeter) Amplifier: DL Instruments Model 1201 - Programmable Voltage Preamplifier (10 To 10000 Gain) The System Can Be Used For Performing Various Flavors Of TIVA/LIVA/RIL/SDL/CTP/LADA/etc. Options Include: SEMICAPS LS 101 Laser Scanner Module; SEMICAPS LS 312 1340NM Laser Pulsing Module; Semicaps El 510 Pulsing (Tbip) Technique; SEMICAPS PC 100 Computer Workstation With Industrial Computer, Keyboard, Mouse, Lcd Monitor, Windows 2000/XP Operating System 2012 Upgrade Include: Enhanced Region Of Interest Selection Options; SIL Capability.

SOFT DOCK SOLUTION SAPPHIRE OPTICAL PROBE INTERFACE: Sapphire Optical Probe Interface - Design & Fabrication Vibration Isolation For Use With Solid Immersion Lens Probers Proprietary Design Allows Use Of Standard Sapphire ATE Load Boards All Instrument Connections & Electrical Performance Maintained 9" Cable Length

EDWARDS Model XDS-35I MECHANICAL DRY VACUUM ROUGHING PUMP: Pumping Speed: 20.6 CFM (either 50Hz or 60Hz) Worldwide voltage: 100V/120V or 200V/230V, 5060Hz, Inlet Connection: NW40, Outlet Connection: NW25, Ultimate Vacuum: 8.0e-3 Torr, Three Position Gas Ballast Selector, Inverter Driven Motor Offers Remote OnOff Control, Boost (70Hz) and Idle (40Hz) Mode Control Available Remotely, Standard US 115V Line Cord Included.

(2008) SAMCO Mdl: UV-1 OZONE CLEANING SYSTEM: A Compact, Bench-Top System That Will Not Damage Delicate Electronic Devices. This Easy To Operate System Uses A Unique Combination Of Ultraviolet Radiation, Ozone & Heat To Gently, Yet Effectively, Remove Organic Materials From A Variety Of Substrates Including: Silicon, Gallium Arsenide, Sapphire, Metals, Ceramics, Quartz & Glass. The Versatile UV-1 Is Well Suited For A Variety Of Applications Such As Substrate Cleaning, Photoresist Descumming, Improving Wettability & UV Curing. By Operating At Atmospheric Pressure The UV-1 Eliminates The Need For A Cumbersome, High-Maintenance, Vacuum System.

(2003) MULTIPROBE Mdl: ATOMIC FORCE PROBER (AFP) 4-PROBE AFP SYSTEM: Multiprobe MP1 (4 Probe) System With Snap Stage Upgrade Model#TS-140 SN#151; Manuals Included; Desk With Monitor Arms Included. 4-Probe AFP System For Electrical Characterization Of Semiconductor Devices. The MP1 System Is The Identical System That Was Used By Most Tier 1 Semiconductor Companies To Develop 65NM, & In Some Cases, 45NM Technologies., Qualified Technology Nodes: 65NM & Greater, Probe Touch-Down: Force Feedback, Probe Motion Control: Automatic, Mouse Positioning, Positioning Resolution: <5NM, Measurement Repeatability: <1mV, <100fA, Measurement Accuracy: 500fA, Tool Uptime: Greater Than 95%, MTBF: 1,000 Hours, Simultaneous Fault Localization: PicoCurrent, Fault Confirmation: IV Curves The MP1 System Comes With: 4 MP1 Probe Heads, A Guarded Chuck, Snap Stage, Multiscan Core Software, Picocurrent Imaging, Active Isolation Table, Computer Rack, Optical Microscope & Enclosure.

TMC Mdl: N-PROBER ANTI-VIBRATION ISOLATION TABLE: TMC Anti-Vibration Platform Dimensions: 40X51X2.5 Inches; 4 Air Suspension Stands

(1998) REVISE Mdl: 9850 SILICON ETCHER: Comes With Two Pumps, Manual & All Peripherals. The System Is Used For Localized Silicon Thinning Using Laser Chemical Etching Process & Can Also Deposit Platinum Lines. System Comes Complete With An Ebara Dry Pump & A Wet Pump For The Deposition Chamber. System Uses An Ar-Ion Laser Manufactured By Coherent With A Maximum Laser Power Of 10W.

(2001) HITACHI Mdl: S-3500N 1307BX-HITACHI BSE DETECTION SYSTEM: With 1307BX-Hitachi Backscatter Electron Detector & A 5-Axis Stage, Rontec XFlash Detector 1106 SN# 0864 & An Oxford WDX-600 Date Of Manufacture 5/95 SN# 2334 Made In USA & EDS System & Oxford EDS Detector Model 7021, SN# 16776-5390-TV1-1188

KEWAUNEE Mdl: SUPREME AIR SOLVENT HOOD: With Solvent Storage Cabinet Bottom Base With Automatic Closing Doors, Standard Control Valves Of Air, Gas, Vacuum & City Water; Configured With Lights & Outlets; 10 Inch Diameter Exhaust Capacity; Dimentions: 48 Inches Width, 36 Inches Depth, 89 Inches Height.

NANOSPEC Mdl: AFT 4000 SCANNING UV: For Thin Film Measurements; SN# 8410; Irvine Optical Corp CA

(2004) NEWPORT Mdl: VH366W-OPT ANTI-VIBRATION TABLE: Requires Air; 1 Inch By 1 Inch, 1/4 Inch Diameter Mounting Hole Size Stainless Mounting Plate Top Surface For Optical Work; Dimensions: 36 X 60 X 32 Inches

TMC ANTI VIBRATION PLATFORM: Dimensions: 40 X 51 X 25 Inches; 4 Air Suspension & Cable Stands

TMC Mdl: 63-561 ANTI VIBRATION TABLE: SN: 9425; Dimensions 36 X 47 X 32 Inches

HIROX Mdl: KH-1000 HI SCOPE OPTICAL MICROSCOPE: User Can Image 360 Around A Stationary Object.

NTA INDUSTRIES Mdl: 2152 ANTI-VIBRATION TABLE: Dimensions 36 X 48 X 30 Inches

CARL ZEISS Mdl: AXIOTRON OPTICAL MICROSCOPE: SN: 705418; Zeiss lenses: 10x, 20x, 50x, 100x, 125x

CARL ZEISS Mdl: AXIOTRON INSPECT OPTICAL MICROSCOPE: SN#705367; Zeiss lenses: 5x, 20x, 50x, 100x, 150x

KINETICS Mdl: 9101-24-23 ANTI-VIBRATION TABLE: SN: KS 130-591; Dimensions 36 X 72 X 31 Inches Tall

OLYMPUS Mdl: MX50: With Newtech Stage

ZYVEX Mdl: S100-4 OPTICAL PROBER: SN: T97616; Optical Prober 51-00-4

SCHLUMBERGER Mdl: IDS 2000

KEWAUNEE Mdl: SUPREME AIR SOLVENT HOOD: Very Nice Condition With 2 Separate Solvent Storage Cabinet Bottom Base With Automatic Closing Doors, Standard Control Valves Of Air, Gas, Vacuum & City Water; Configured With Lights & Outlets; 10 Inch Diameter Exhaust Capacity; Dimensions: 71 Inches Width, 36 Inches Depth, 89 Inches Height; Electronic Air Alert 300 Airflow Monitor

NEWPORT Mdl: RS4000 VIBRATION TABLE: 1 Inch By 1 Inch By 1/4 Inch Diameter Drilled & Tapped Mounting Hole Tabletop With Tuned Dampening; 4 Air Suspension Base Stands 22 Inches Tall Newport Stabilizer Laminator Flow Isolator I-2000 Series; Platform That Sits On The Stand 48 Inches Wide, 12 Inches Thick & 96 Inches Long; Built For Mounting Laser Optics

PLAS MOS Mdl: SD4000 THIN FILM MEASUREMENT SYSTEM: SN: 50771093; Dimensions: 56 Inches Wide, 30 Inches Deep, 76 Inches Tall

(1996) CARL ZEISS Mdl: 321 ZEISS LSM 321: Zeiss LSM With Electric Forklift: Service Id#095376 Built On A TMC Vibration Table; X/Y Stage; In A Dark Box; Zeiss LMS 321 IR

CARL ZEISS Mdl: JENAPLAN METALLURGICAL REFLECTED-LIGHT MICROSCOPE: Upgrade With Digital Camera.

LEICA Mdl: POLYLITE 88 LIGHT MICROSCOPE: SN# 4133568

ERNST LEITZ WETZLAR Mdl: ERGOLUX LIGHT MICROSCOPE: SN# 540096

(2009) MCM DELIDDER: To Remove MCM Lid.

(2010) ALLIED HIGH TECH T/R TRANSDUCER CABLE (QAL000021): Acoustic Signal Cables For Sonoscan Machine

(2010) ENVIROTRONICS Mdl: TSV4-2-2-5-WC-X TWO ZONE VERTICAL THERMAL SHOCK CHAMBER: For Testing With Extreme Temperature Ranges.

(2006) HITACHI Mdl: TM1000 PORTABLE TABLE TOP SEM: Table Top SEM With Limited Resolution, Magnification & Fixed Accelerating Voltage For Rapid Inspection For Package Analysis. Already Fully Depreciated.

(2000) HIROX Mdl: MX5030Z 3D OPTICAL SCOPE: For Construction Analysis To Perform Inspection On Chip Cap (Auto-Rotating System For Chip Cap Inspection)

(1989) Olympus Mdl: SZZH LOW POWER OPTICAL SCOPE: For Inspection Magnification & Image N. E Capture Of Packages From 1X To 80X

(2002) DCG EMISCOPE 1: SN# 3100202, The Tool Is Used To Perform Time Resolved Emission Which Can Be Used To Estimate When Exactly A Transistor In The DUT Toggles. The Temporal Resolution Of The Tool Is 100-120 PS & Is Easy To Interface With A Tester Creating Great Value For Fault Isolation Up To 90nm Technology. Reselling The Tool Outside The US Will Be Subject To ITAR Approval By The US Govt. Hitachi VPSEM Mdl: S-3400N SEM - TYPE II: SN# 340990-01, A Specially Designed "Variable Pressure" SEM Used In Package Analysis Inspection For NPI, Quals & Customer Returns. Package Materials Cannot Be Imaged In High Resolution Sems Due To Outgassing (Contamination) & Charging.

(2005) LGI ANTI-VIBRATION ISOLATION TABLE: Dimension : 75cm x 75cm x 90cm

CARL ZEISS Mdl: AXIOTRON HIGH POWER OPTICAL SCOPE: High Performance Optical Microscope With 5 Magnification Lens, Bright Field & Dark Field Imaging

HP Mdl: 4145B PARAMETRIC ANALYZER: SN# 2830J022822, Electrical characterization instrument.

AGILENT Mdl: 8510C PARAMETRIC ANALYZER: SN# 20930, Instrument That Measure Reflection & Transmission Of Electrical Network

TUTHILL CORPORATION Mdl: KVAC 21 MECHANICAL WET VACUUM ROUGHING PUMP: SN# 374901

TUTHILL CORPORATION Mdl: KVC-18 MECHANICAL WET VACUUM ROUGHING PUMP: SN# 341566

EDWARDS Mdl: IQ1311004 MECHANICAL DRY VACUUM ROUGHING PUMP: SN# 46213346

TEK-TEMP Mdl: LK-10 CHILLER: Water Chiller Temperature For Cooling Turbo Pump By Maintaining A Constant Temperature

(2006) SEMICAPS Mdl: STM32 SAMPLE THICKNESS MEASUREMENT: SN# STM-T06-0001, Uses Laser Beam To Measure The Thickness Of Mechanically Prepared TEM Samples To Ensure They Are Thin Enough For Electron Transparency.

INOVYS Mdl: POCELOT PERSONAL OCELOT ATE: SN# 800647-P, Automated Test Equipment (ATE) With 256 Pin-Count. Used For Semiconductor Digital Testing Especially Scan Test.

HP Mdl: 6621A DDC POWER SUPPLY: SN# 3446A023222, DC Power Supply. Comes With 2 Outputs. Can Be Configured Into Either 7V(10A) Or 20V(4A)

(Last Day Of Removal Is Friday June 28th)

Photo Gallery:

Featuring:

In Conjunction With Maynards Industries

(2008) CHA SOLUTION ELECTRON BEAM EVAPORATOR: With 4 Pocket E-Beam Evaporator (4 X 25 CC) With 10 KW Power Supply. Equipped With Cryo Pump & With PLC: Siemens Touch Screen System Controller. Has 3 –cm Dia Ion Beam Source (Veeco With GFC-1000 Mass Flow Controller & Power Supply) For IBAD (Ion Beam Assisted Deposition). Complete With Adjustable Angle Planetary. The System Is Fully Functional.

ALPHA LICAT LASER SCANNING MICROSCOPE: Downward Looking Laser Scanning Microscope (LSM) With 500MW 1064 Laser & A New (In 2012) 1340 Laser . System Has 5X/10X/20X/50X/100X Optics. Sourcemeter: Keithley Model 2420 (+/-60V, +/-3A Sourcemeter) Amplifier: DL Instruments Model 1201 - Programmable Voltage Preamplifier (10 To 10000 Gain) The System Can Be Used For Performing Various Flavors Of TIVA/LIVA/RIL/SDL/CTP/LADA/etc. Options Include: SEMICAPS LS 101 Laser Scanner Module; SEMICAPS LS 312 1340NM Laser Pulsing Module; Semicaps El 510 Pulsing (Tbip) Technique; SEMICAPS PC 100 Computer Workstation With Industrial Computer, Keyboard, Mouse, Lcd Monitor, Windows 2000/XP Operating System 2012 Upgrade Include: Enhanced Region Of Interest Selection Options; SIL Capability.

SOFT DOCK SOLUTION SAPPHIRE OPTICAL PROBE INTERFACE: Sapphire Optical Probe Interface - Design & Fabrication Vibration Isolation For Use With Solid Immersion Lens Probers Proprietary Design Allows Use Of Standard Sapphire ATE Load Boards All Instrument Connections & Electrical Performance Maintained 9" Cable Length

EDWARDS Model XDS-35I MECHANICAL DRY VACUUM ROUGHING PUMP: Pumping Speed: 20.6 CFM (either 50Hz or 60Hz) Worldwide voltage: 100V/120V or 200V/230V, 5060Hz, Inlet Connection: NW40, Outlet Connection: NW25, Ultimate Vacuum: 8.0e-3 Torr, Three Position Gas Ballast Selector, Inverter Driven Motor Offers Remote OnOff Control, Boost (70Hz) and Idle (40Hz) Mode Control Available Remotely, Standard US 115V Line Cord Included.

(2008) SAMCO Mdl: UV-1 OZONE CLEANING SYSTEM: A Compact, Bench-Top System That Will Not Damage Delicate Electronic Devices. This Easy To Operate System Uses A Unique Combination Of Ultraviolet Radiation, Ozone & Heat To Gently, Yet Effectively, Remove Organic Materials From A Variety Of Substrates Including: Silicon, Gallium Arsenide, Sapphire, Metals, Ceramics, Quartz & Glass. The Versatile UV-1 Is Well Suited For A Variety Of Applications Such As Substrate Cleaning, Photoresist Descumming, Improving Wettability & UV Curing. By Operating At Atmospheric Pressure The UV-1 Eliminates The Need For A Cumbersome, High-Maintenance, Vacuum System.

(2003) MULTIPROBE Mdl: ATOMIC FORCE PROBER (AFP) 4-PROBE AFP SYSTEM: Multiprobe MP1 (4 Probe) System With Snap Stage Upgrade Model#TS-140 SN#151; Manuals Included; Desk With Monitor Arms Included. 4-Probe AFP System For Electrical Characterization Of Semiconductor Devices. The MP1 System Is The Identical System That Was Used By Most Tier 1 Semiconductor Companies To Develop 65NM, & In Some Cases, 45NM Technologies., Qualified Technology Nodes: 65NM & Greater, Probe Touch-Down: Force Feedback, Probe Motion Control: Automatic, Mouse Positioning, Positioning Resolution: <5NM, Measurement Repeatability: <1mV, <100fA, Measurement Accuracy: 500fA, Tool Uptime: Greater Than 95%, MTBF: 1,000 Hours, Simultaneous Fault Localization: PicoCurrent, Fault Confirmation: IV Curves The MP1 System Comes With: 4 MP1 Probe Heads, A Guarded Chuck, Snap Stage, Multiscan Core Software, Picocurrent Imaging, Active Isolation Table, Computer Rack, Optical Microscope & Enclosure.

TMC Mdl: N-PROBER ANTI-VIBRATION ISOLATION TABLE: TMC Anti-Vibration Platform Dimensions: 40X51X2.5 Inches; 4 Air Suspension Stands

(1998) REVISE Mdl: 9850 SILICON ETCHER: Comes With Two Pumps, Manual & All Peripherals. The System Is Used For Localized Silicon Thinning Using Laser Chemical Etching Process & Can Also Deposit Platinum Lines. System Comes Complete With An Ebara Dry Pump & A Wet Pump For The Deposition Chamber. System Uses An Ar-Ion Laser Manufactured By Coherent With A Maximum Laser Power Of 10W.

(2001) HITACHI Mdl: S-3500N 1307BX-HITACHI BSE DETECTION SYSTEM: With 1307BX-Hitachi Backscatter Electron Detector & A 5-Axis Stage, Rontec XFlash Detector 1106 SN# 0864 & An Oxford WDX-600 Date Of Manufacture 5/95 SN# 2334 Made In USA & EDS System & Oxford EDS Detector Model 7021, SN# 16776-5390-TV1-1188

KEWAUNEE Mdl: SUPREME AIR SOLVENT HOOD: With Solvent Storage Cabinet Bottom Base With Automatic Closing Doors, Standard Control Valves Of Air, Gas, Vacuum & City Water; Configured With Lights & Outlets; 10 Inch Diameter Exhaust Capacity; Dimentions: 48 Inches Width, 36 Inches Depth, 89 Inches Height.

NANOSPEC Mdl: AFT 4000 SCANNING UV: For Thin Film Measurements; SN# 8410; Irvine Optical Corp CA

(2004) NEWPORT Mdl: VH366W-OPT ANTI-VIBRATION TABLE: Requires Air; 1 Inch By 1 Inch, 1/4 Inch Diameter Mounting Hole Size Stainless Mounting Plate Top Surface For Optical Work; Dimensions: 36 X 60 X 32 Inches

TMC ANTI VIBRATION PLATFORM: Dimensions: 40 X 51 X 25 Inches; 4 Air Suspension & Cable Stands

TMC Mdl: 63-561 ANTI VIBRATION TABLE: SN: 9425; Dimensions 36 X 47 X 32 Inches

HIROX Mdl: KH-1000 HI SCOPE OPTICAL MICROSCOPE: User Can Image 360 Around A Stationary Object.

NTA INDUSTRIES Mdl: 2152 ANTI-VIBRATION TABLE: Dimensions 36 X 48 X 30 Inches

CARL ZEISS Mdl: AXIOTRON OPTICAL MICROSCOPE: SN: 705418; Zeiss lenses: 10x, 20x, 50x, 100x, 125x

CARL ZEISS Mdl: AXIOTRON INSPECT OPTICAL MICROSCOPE: SN#705367; Zeiss lenses: 5x, 20x, 50x, 100x, 150x

KINETICS Mdl: 9101-24-23 ANTI-VIBRATION TABLE: SN: KS 130-591; Dimensions 36 X 72 X 31 Inches Tall

OLYMPUS Mdl: MX50: With Newtech Stage

ZYVEX Mdl: S100-4 OPTICAL PROBER: SN: T97616; Optical Prober 51-00-4

SCHLUMBERGER Mdl: IDS 2000

KEWAUNEE Mdl: SUPREME AIR SOLVENT HOOD: Very Nice Condition With 2 Separate Solvent Storage Cabinet Bottom Base With Automatic Closing Doors, Standard Control Valves Of Air, Gas, Vacuum & City Water; Configured With Lights & Outlets; 10 Inch Diameter Exhaust Capacity; Dimensions: 71 Inches Width, 36 Inches Depth, 89 Inches Height; Electronic Air Alert 300 Airflow Monitor

NEWPORT Mdl: RS4000 VIBRATION TABLE: 1 Inch By 1 Inch By 1/4 Inch Diameter Drilled & Tapped Mounting Hole Tabletop With Tuned Dampening; 4 Air Suspension Base Stands 22 Inches Tall Newport Stabilizer Laminator Flow Isolator I-2000 Series; Platform That Sits On The Stand 48 Inches Wide, 12 Inches Thick & 96 Inches Long; Built For Mounting Laser Optics

PLAS MOS Mdl: SD4000 THIN FILM MEASUREMENT SYSTEM: SN: 50771093; Dimensions: 56 Inches Wide, 30 Inches Deep, 76 Inches Tall

(1996) CARL ZEISS Mdl: 321 ZEISS LSM 321: Zeiss LSM With Electric Forklift: Service Id#095376 Built On A TMC Vibration Table; X/Y Stage; In A Dark Box; Zeiss LMS 321 IR

CARL ZEISS Mdl: JENAPLAN METALLURGICAL REFLECTED-LIGHT MICROSCOPE: Upgrade With Digital Camera.

LEICA Mdl: POLYLITE 88 LIGHT MICROSCOPE: SN# 4133568

ERNST LEITZ WETZLAR Mdl: ERGOLUX LIGHT MICROSCOPE: SN# 540096

(2009) MCM DELIDDER: To Remove MCM Lid.

(2010) ALLIED HIGH TECH T/R TRANSDUCER CABLE (QAL000021): Acoustic Signal Cables For Sonoscan Machine

(2010) ENVIROTRONICS Mdl: TSV4-2-2-5-WC-X TWO ZONE VERTICAL THERMAL SHOCK CHAMBER: For Testing With Extreme Temperature Ranges.

(2006) HITACHI Mdl: TM1000 PORTABLE TABLE TOP SEM: Table Top SEM With Limited Resolution, Magnification & Fixed Accelerating Voltage For Rapid Inspection For Package Analysis. Already Fully Depreciated.

(2000) HIROX Mdl: MX5030Z 3D OPTICAL SCOPE: For Construction Analysis To Perform Inspection On Chip Cap (Auto-Rotating System For Chip Cap Inspection)

(1989) Olympus Mdl: SZZH LOW POWER OPTICAL SCOPE: For Inspection Magnification & Image N. E Capture Of Packages From 1X To 80X

(2002) DCG EMISCOPE 1: SN# 3100202, The Tool Is Used To Perform Time Resolved Emission Which Can Be Used To Estimate When Exactly A Transistor In The DUT Toggles. The Temporal Resolution Of The Tool Is 100-120 PS & Is Easy To Interface With A Tester Creating Great Value For Fault Isolation Up To 90nm Technology. Reselling The Tool Outside The US Will Be Subject To ITAR Approval By The US Govt. Hitachi VPSEM Mdl: S-3400N SEM - TYPE II: SN# 340990-01, A Specially Designed "Variable Pressure" SEM Used In Package Analysis Inspection For NPI, Quals & Customer Returns. Package Materials Cannot Be Imaged In High Resolution Sems Due To Outgassing (Contamination) & Charging.

(2005) LGI ANTI-VIBRATION ISOLATION TABLE: Dimension : 75cm x 75cm x 90cm

CARL ZEISS Mdl: AXIOTRON HIGH POWER OPTICAL SCOPE: High Performance Optical Microscope With 5 Magnification Lens, Bright Field & Dark Field Imaging

HP Mdl: 4145B PARAMETRIC ANALYZER: SN# 2830J022822, Electrical characterization instrument.

AGILENT Mdl: 8510C PARAMETRIC ANALYZER: SN# 20930, Instrument That Measure Reflection & Transmission Of Electrical Network

TUTHILL CORPORATION Mdl: KVAC 21 MECHANICAL WET VACUUM ROUGHING PUMP: SN# 374901

TUTHILL CORPORATION Mdl: KVC-18 MECHANICAL WET VACUUM ROUGHING PUMP: SN# 341566

EDWARDS Mdl: IQ1311004 MECHANICAL DRY VACUUM ROUGHING PUMP: SN# 46213346

TEK-TEMP Mdl: LK-10 CHILLER: Water Chiller Temperature For Cooling Turbo Pump By Maintaining A Constant Temperature

(2006) SEMICAPS Mdl: STM32 SAMPLE THICKNESS MEASUREMENT: SN# STM-T06-0001, Uses Laser Beam To Measure The Thickness Of Mechanically Prepared TEM Samples To Ensure They Are Thin Enough For Electron Transparency.

INOVYS Mdl: POCELOT PERSONAL OCELOT ATE: SN# 800647-P, Automated Test Equipment (ATE) With 256 Pin-Count. Used For Semiconductor Digital Testing Especially Scan Test.

HP Mdl: 6621A DDC POWER SUPPLY: SN# 3446A023222, DC Power Supply. Comes With 2 Outputs. Can Be Configured Into Either 7V(10A) Or 20V(4A)

(Last Day Of Removal Is Friday June 28th)

Removal Info:

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